Sample preparation methods for optimal HS-AFM analysis: Duplex stainless steel

The contact mode high-speed atomic force microscope (AFM) operates orders of magnitude faster than conventional AFMs. It is capable capturing multiple frames per second with nanometre-scale lateral resolution and subatomic height resolution. This advancement in imaging rate allows for microscale analysis across macroscale surfaces, making it suitable applications materials science. However, the quality surface obtained by AFM highly dependent upon standard sample preparation resultant final finish. In this study, different techniques that are commonly implemented within metallurgical studies compared samples SAF 2205 duplex stainless steel. was found that, while acid etching electrolytic were optimal low optical microscopy, these methods less suited high AFM. Mechanical colloidal silica polishing to be method explored, as provided a gentle etch allowing topographic maps surface.